Mask/Wafer Inspection Station
Bright-light reflection containment chamber with a LED light source. The system includes an integrated automatic on / off motion sensor switch. Substrates are manually placed into the black light absorbing chamber and viewed under the concentrated light source. The enclosed table-top design provides the operator with a controlled macro light inspection while capturing and diffusing most deflected light.
Product
Description
Mask Inspection Station. The mask inspection station is a bright light station for macro examination of reticles, masks or wafers. Used with H-Square mask picks this allows operators to see the entire surface of the mask under bright light conditions. Dimensions are 18″ x 18″ x 18″. Unit is supplied with optional yellow filter
H-Square uses a Return Material Authorization (RMA) process. If you need to return a product, contact us at info@h-square.com to receive an RMA number. Please state name, product part number and reason for return. Once you receive the RMA number, ship the product back to H-Square. Customer is responsible for shipping costs to return product.
- If the product is being returned under warranty as defective, it will be repaired or replaced at no charge after evaluation.
- If product is being returned unused and unopened within 30 days, a full refund will be offered, less original shipping charges.
- If the product is being returned used within 30 days, product will be evaluated for condition and customer refunded accordingly.
- Products over 30 days cannot be returned for refund.